3D Pulsed Laser LEAP Characterization of Semiconductor Heterostructures

3D pulse laser leap characterization equipment and experiment results

Interfaces and Ohmic Contacts to WBG Semiconductors

Interfaces characterization image and graphs

Influence of Noise on Device Performance and DLTS Electronic Trap Signature Characterization

Equipment setup photos and result graphs

Advanced RF and mm-Wave Characterization

Characterization equipment photos and result graph

Radiation Damage and Extreme Environment Conditions in Materials and Devices

Experiment setup photos, illustrations and result graphs